Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits [Metric]1
This standard is issued under the ﬁxed designation F 1262M; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
Click below to download ASTM F 1262M – 95 pdf free